ED-XRF is Non-destructive method of analysis of element from Na (11) to Uranium (92). By using ED-XRD analytical concentration range can be analyzed from 0.1PPM to 100%. This instrument is designed to fulfill the requirements of end-users. More accurate, good precise data, fast measurement of speed(30s-900s). EDXRF spectrometer provides simultaneous measurement of sample containing hazardous elements such as Pb, Cd, Hg, Cr, Br, Sb, As for RoHS. Suitable for every sample, from thin cables and electronic parts to bulk samples
XRF and EDXRF spectrometers are the elemental analysis tool of choice, for many applications, in that they are smaller, simpler in design and cost less to operate than other technologies like inductively coupled plasma optical emission spectroscopy (ICP-OES) and atomic absorption (AA) or atomic fluorescence (AF) spectroscopy. Examples of some common EDXRF applications are: Cement and raw meal: sulfur, iron, calcium, silicon, aluminum, magnesium, etc. Kaolin clay: titanium, iron, aluminum, silicon, etc.; Granular catalysts: palladium, platinum, rhodium, ruthenium, etc. Ores: copper, tin, gold, silver, etc. Cement and mortar fillers: sulfur in ash
This type of XRF instrumentation separates the characteristic x-rays of different elements into a complete fluorescence energy spectrum which is then processed for qualitative or quantitative analysis. Filters positioned between sample and detector are used to improve signal, background reduction, and focus on certain regions of the spectra
Working Principle
The EDXRF spectrometer is designed according to Moseley’s law. The spectrometer consists of a power supply, a light path subsystem, a control circuit, and a personal computer (PC). High-voltage power is supplied to the X-ray tube to emit a primary X-ray, which irradiates the sample. The sample is then stimulated to emit XRF, which is received by an XRF detector. The detector classifies the received photons according to energy and counts the number of photons that correspond to different energy levels. The detector then sends the results to the PC, which completes the qualitative and quantitative analyses.
$4000.00
| Instrument | Energy Dispersive X-ray Fluorescence Spectrometry |
| Measuring Elements | Na (11) – U (92) |
| Sample Type | Solid, Liquid and Powder |
| Samples | Any Arbitrary size, any irregular shape |
| Minimum Measuring limit | Cd/Hg/Br/Cr/Pb ≤ 2 PPM |
| X-ray tube | {"Target":"Mo","Tube Voltage":"5 - 50KV","Tube current":"1-1000 \u00b5A"} |
| Sample Exposure Diameter | 2,5,8 mm |
| Analysis Method | Theoretical α coefficient method, basic parameter method, empirical coefficient method |
| Analysis time | 30 – 900 seconds, adjustable |
| High Voltage Generator | Special HV generator for X fluorescence |
| ADC | 2048 channels |
| Filter | 6 Filter are automatically selected and converted |
| Sample Observation | 200 x color CCD camera |
| Detector | Si-PIN or SDD detector, high speed pulse height analysis system |
| Analysis Software | Patented Software |
| Data Processing System | {"Host":"PC Business model","CPU":"\u2265 2.8G","Memory":"\u2265 4G","Hard disk":"\u2265 4G","Display":"22\u201d LCD display","Working Environment":"Temperature 10 \u2013 35C, humidity 30 \u2013 70% RH","Power Controller":"+5 VDC at 250 mA (1.2W), Constant colling control: 400 VDC"} |
Smart, simple, small, speedy & safe analysis
X ray tube: The x-ray tube, specially treated with embedded lead inside is shielded in full range, leaving only the side window for the x ray outlet. The canned insulting oil is used for high voltage insulation and colling,0.005-inch Beryllium window, rated consumption power 50W, rated power 50kV, Designed service life >15000h
High voltage generator: Input:85~265VAC,47~63Hz, Power factor correction
1kV~5kV comply to UL85~250VAC input standard voltage variation:0.01% of output voltage from no load to full load current variation:0~rated power, 0.01% of output current Ripple: Peak-Peak of output voltage 0.25%
Radiation shielded system: Newly designed and specially treated X-ray tube with low-radiation, fully enclosed lead plate double shield design, Automatic filtering device for lead plate, X-ray interrupters in case of sample unexpected cover opening, delay testing and X-ray warning system
Automatic filter conversion system: Filters are automatically selected and converted
(Filter Functions: The energy spectrum component of the excitation line can be improved to suppress the strong X-ray fluorescence of high content components and improve the measurement accuracy of the elements to be measured)
The detection limit of harmful elements: Cd, Pb, Cr, Hg and Br is restricted according to ROHS instruction: Detection limit (Cd, Pb, Cr, Hg, Br):2PPM
Si (PIN) or SDD detector: The resolution of detector is one of the main indexes to evaluate the performance of energy dispersive XRF spectrometer
Resolution< 145eV (The lower the resolution, the higher the sensitivity)
Counting rate>15mm2, Beryllium window thickness = 0.025mm, Detector power<1.2W
Powerful analysis software workstation:
User friendly software offers all sophisticated features
Real-time monitoring of Instrument working status
Simultaneous measurement of Elements
Quick Elemental analysis
Analysis time is adjustable from 30 seconds to 900 seconds
Temperature control of X-ray tube to extend its service life
The most advanced method of analysis: Qualitative & Quantitative
Customized report function, no need to set parameters
Analyzed sample data is automatically stored in data files
Peak Location, Peak Recognition, Element determination.
Energy dispersive X-ray fluorescence spectrometer (XRF) is widely used in
Environmental Protection
Geology
Mineral
Metallurgy
Cement
Electronics
Petrochemical
Polymer
Food
Medicine
Product Research & Development
Product process monitoring
Archaeology
Building materials
Quality control Labs
Our Wavelength Dispersive X-Ray Fluorescence (WDXRF) offers precise elemental analysis for various materials. They provide excellent quantitative accuracy and stability, ideal for routine analysis. Their high spectral resolution allows accurate identification even in complex samples. These WDXRF systems ensure quality control, product consistency, and regulatory compliance, providing precise elemental analysis. Our Wavelength Dispersive X-Ray Fluorescence (WDXRF) used in geology, mining, cement, and environmental analysis.
Our Energy Dispersive X-Ray Fluorescence Spectrometers offer fast, non-destructive elemental analysis for various materials. They provide quick, non-destructive measurements of materials without extensive sample preparation. Their key features include high sensitivity, real-time analysis for solid, liquid, and powdered samples. These provide accurate elemental analysis, ensuring material compliance and safety. We offer Energy Dispersive X-Ray Fluorescence Spectrometers used in geology, monitoring, and quality control.
