X-Ray Fluorescence Spectrometer ED-XRF1010

Description:

ED-XRF is Non-destructive method of analysis of element from Na (11) to Uranium (92). By using ED-XRD analytical concentration range can be analyzed from 0.1PPM to 100%. This instrument is designed to fulfill the requirements of end-users. More accurate, good precise data, fast measurement of speed(30s-900s). EDXRF spectrometer provides simultaneous measurement of sample containing hazardous elements such as Pb, Cd, Hg, Cr, Br, Sb, As for RoHS. Suitable for every sample, from thin cables and electronic parts to bulk samples

XRF and EDXRF spectrometers are the elemental analysis tool of choice, for many applications, in that they are smaller, simpler in design and cost less to operate than other technologies like inductively coupled plasma optical emission spectroscopy (ICP-OES) and atomic absorption (AA) or atomic fluorescence (AF) spectroscopy. Examples of some common EDXRF applications are: Cement and raw meal: sulfur, iron, calcium, silicon, aluminum, magnesium, etc. Kaolin clay: titanium, iron, aluminum, silicon, etc.; Granular catalysts: palladium, platinum, rhodium, ruthenium, etc. Ores: copper, tin, gold, silver, etc. Cement and mortar fillers: sulfur in ash

This type of XRF instrumentation separates the characteristic x-rays of different elements into a complete fluorescence energy spectrum which is then processed for qualitative or quantitative analysis. Filters positioned between sample and detector are used to improve signal, background reduction, and focus on certain regions of the spectra

Working Principle
The EDXRF spectrometer is designed according to Moseley’s law. The spectrometer consists of a power supply, a light path subsystem, a control circuit, and a personal computer (PC). High-voltage power is supplied to the X-ray tube to emit a primary X-ray, which irradiates the sample. The sample is then stimulated to emit XRF, which is received by an XRF detector. The detector classifies the received photons according to energy and counts the number of photons that correspond to different energy levels. The detector then sends the results to the PC, which completes the qualitative and quantitative analyses.

Specifications:

Instrument	Energy Dispersive X-ray Fluorescence Spectrometry
Measuring Elements	Na (11) – U (92)
Sample Type	Solid, Liquid and Powder
Samples	Any Arbitrary size, any irregular shape
Minimum Measuring limit	Cd/Hg/Br/Cr/Pb ≤ 2 PPM
X-ray tube	Target Mo Tube Voltage 5 - 50KV Tube current 1-1000 µA
Sample Exposure Diameter	2,5,8 mm
Analysis Method	Theoretical α coefficient method, basic parameter method, empirical coefficient method
Analysis time	30 – 900 seconds, adjustable
High Voltage Generator	Special HV generator for X fluorescence
ADC	2048 channels
Filter	6 Filter are automatically selected and converted
Sample Observation	200 x color CCD camera
Detector	Si-PIN or SDD detector, high speed pulse height analysis system
Analysis Software	Patented Software
Data Processing System	Host PC Business model CPU ≥ 2.8G Memory ≥ 4G Hard disk ≥ 4G Display 22” LCD display Working Environment Temperature 10 – 35C, humidity 30 – 70% RH Power Controller +5 VDC at 250 mA (1.2W), Constant colling control: 400 VDC

Features:

• Smart, simple, small, speedy & safe analysis
• X ray tube: The x-ray tube, specially treated with embedded lead inside is shielded in full range, leaving only the side window for the x ray outlet. The canned insulting oil is used for high voltage insulation and colling,0.005-inch Beryllium window, rated consumption power 50W, rated power 50kV, Designed service life >15000h
• High voltage generator: Input:85~265VAC,47~63Hz, Power factor correction 1kV~5kV comply to UL85~250VAC input standard voltage variation:0.01% of output voltage from no load to full load current variation:0~rated power, 0.01% of output current Ripple: Peak-Peak of output voltage 0.25%
• Radiation shielded system: Newly designed and specially treated X-ray tube with low-radiation, fully enclosed lead plate double shield design, Automatic filtering device for lead plate, X-ray interrupters in case of sample unexpected cover opening, delay testing and X-ray warning system
• Automatic filter conversion system: Filters are automatically selected and converted
• (Filter Functions: The energy spectrum component of the excitation line can be improved to suppress the strong X-ray fluorescence of high content components and improve the measurement accuracy of the elements to be measured)
• The detection limit of harmful elements: Cd, Pb, Cr, Hg and Br is restricted according to ROHS instruction: Detection limit (Cd, Pb, Cr, Hg, Br):2PPM
• Si (PIN) or SDD detector: The resolution of detector is one of the main indexes to evaluate the performance of energy dispersive XRF spectrometer Resolution< 145eV (The lower the resolution, the higher the sensitivity)
• Counting rate>15mm2, Beryllium window thickness = 0.025mm, Detector power<1.2W
• Powerful analysis software workstation: User friendly software offers all sophisticated features
• Real-time monitoring of Instrument working status
• Simultaneous measurement of Elements
• Quick Elemental analysis
• Analysis time is adjustable from 30 seconds to 900 seconds
• Temperature control of X-ray tube to extend its service life
• The most advanced method of analysis: Qualitative & Quantitative
• Customized report function, no need to set parameters
• Analyzed sample data is automatically stored in data files
• Peak Location, Peak Recognition, Element determination.

Applications:

Energy dispersive X-ray fluorescence spectrometer (XRF) is widely used in Environmental Protection
Geology
Mineral
Metallurgy
Cement
Electronics
Petrochemical
Polymer
Food
Medicine
Product Research & Development
Product process monitoring
Archaeology
Building materials
Quality control Labs